lhr3330/p1 a doc. no : qw0905- rev. : date : 27 - jun - 2005 lhr3330/p1 data sheet super bright round type led lamps ligitek electronics co.,ltd. property of ligitek only
100% 75% 50% 25% 0 25% 75% 50% 100% -60 x -30 x 60 x 0 x 30 x note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. directivity radiation ligitek electronics co.,ltd. property of ligitek only lhr3330/p1 package dimensions part no. page 1/4 5.0 2.54typ 1.5max ?? 0.5 typ 7.6 25.0min 1.0min 8.6 5.9 12.8 ? 0.5
ligitek electronics co.,ltd. property of ligitek only typical electrical & optical characteristics (ta=25 j ) note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. lhr3330/p1 part no peak wave length f pnm red diffused color gaalas red material emitted 660 lens operating temperature t opr soldering temperature storage temperature tsol tstg forward current peak forward current duty 1/10@10khz reverse current @5v power dissipation i fp ir pd parameter i f symbol part no. lhr3330/p1 absolute maximum ratings at ta=25 j luminous intensity @20ma(mcd) spectral halfwidth ??f nm forward voltage @ ma(v) viewing angle 2 c 1/2 (deg) 120 min. 1.5 20 2.4 min. 20 max. 36 300 typ. j -40 ~ +85 max 260 j for 5 sec max (2mm from body) -40 ~ +100 j 100 10 100 g a mw ma hr 30 ratings ma unit page 2/4
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity@20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0 0.5 -40 -20 -0 20 600 650 0 2.0 3.0 4.0 5.0 40 60 0.8 -0 -20 -40 40 60 20 0 0.5 0.9 1.0 1.1 1.2 1.0 1.5 2.0 650 700 750 0.5 1.0 1.0 1.5 2.0 2.5 3.0 100 80 100 80 2.5 3.0 hr chip page 3/4 part no. lhr3330/p1
mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec solderability test this test intended to see soldering well performed or not. part no. lhr3330/p1 reliability test: solder resistance test thermal shock test high temperature high humidity test low temperature storage test high temperature storage test operating life test test item the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. the purpose of this test is the resistance of the device under tropical for hous. 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202:103b jis c 7021: b-11 description the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) test condition mil-std-883:1008 jis c 7021: b-10 jis c 7021: b-12 reference standard mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 ligitek electronics co.,ltd. property of ligitek only page 4/4
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